Chimie des Polymères

Méthode de base de l'imagerie de micro et nanostructuresavec le microscope à force atomique (AFM)



Principle

Approaching a sharp silicon tip mounted on a cantilever to a sample surface leads to an atomic scale interaction. The result is a bend of the cantilever which is detected by a laser. In static mode the resulting deflection is used to investigate the topography of the ...